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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Optical metrology of shape-varying nano-patterned gratings by analyzing the scattering signals in their pupil images
Details
Optical metrology of shape-varying nano-patterned gratings by analyzing the scattering signals in their pupil images
Journal
International Microprocesses and Nanotechnology Conference
Pages
26P-7-4
Date Issued
2011-10
Author(s)
Yen-Min Lee
Jia-Han Li
Fu-Min Wang
Hsin-Hung Cheng
Yu-Tian Shen
Kuen-Yu Tsai
Alek C. Chen
KUEN-YU TSAI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/366473
Type
conference paper