A scanning contact probe for a micro-coordinate measuring machine (CMM)

Resource

MEASUREMENT SCIENCE & TECHNOLOGY, 21(5), 054002

Journal

Measurement Science and Technology

Pages

54002

Date Issued

2010

Date

2010

Author(s)

Fan, Kuang-Chao

Wang, Weili

Chen, Yejin

Lin, Jia-You

DOI

URI

Type

journal article

File(s)

Name

402.pdf

Size

23.39 KB

Format

Adobe PDF

Checksum

(MD5):5d5416760c1fdd1800b8c2635a4c0b08