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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices
Details
PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices
Journal
Design, Automation and Test in Europe
Journal Volume
2015-April
Pages
1209-1212
Date Issued
2015
Author(s)
Chen, F.-H.
Yang, M.-C.
Chang, Y.-H.
TEI-WEI KUO
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84945961533&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/392755
Type
conference paper
