Quantum-mechanical calculation of carrier distribution in MOS accumulation and strong inversion layers
Journal
AIP Advances
Journal Volume
3
Journal Issue
10
Date Issued
2013
Author(s)
Abstract
We derive a statistical physics model of two-dimensional electron gas (2DEG) and propose an accurate approximation method for calculating the quantum-mechanical effects of metal-oxide-semiconductor (MOS) structure in accumulation and strong inversion regions. We use an exponential surface potential approximation in solving the quantization energy levels and derive the function of density of states in 2D to 3D transition region by applying uncertainty principle and Schrödinger equation in k-space. The simulation results show that our approximation method and theory of density of states solve the two major problems of previous researches: the non-negligible error caused by the linear potential approximation and the inconsistency of density of states and carrier distribution in 2D to 3D transition region. © 2013 Author(s).
SDGs
Type
journal article