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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Analysis of STI Mechanical-Stress Induced Effects of Nanometer PD SOI NMOS Devices
Details
Analysis of STI Mechanical-Stress Induced Effects of Nanometer PD SOI NMOS Devices
Journal
SRC Conference
Date Issued
2008-05
Author(s)
JAMES-B KUO
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/342562
Type
conference paper