Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Interconnect delay and slew metrics using the extreme value distribution
Details
Interconnect delay and slew metrics using the extreme value distribution
Journal
Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Pages
818-823
Date Issued
2010
Author(s)
Zeng, J.-K.
CHUNG-PING CHEN
DOI
10.1109/ISQED.2010.5450483
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501047
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-77952664349&doi=10.1109%2fISQED.2010.5450483&partnerID=40&md5=0ccb30d37ffab5d00978b0cd2ca7675c
Type
conference paper
