Intelligent process diagnosis based on end-of-line electrical test data

Resource

Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT

Journal

Electronics Manufacturing Technology Symposium, 1996.

ISBN

0-7803-3642-9

Date Issued

1996-10

Date

1996-10

Author(s)

Tsai, Cheng-Kai

Lee, Jian-Huei

Chang, Shi-Chung

DOI

URI

Type

conference paper

File(s)

Name

00559754.pdf

Size

726.52 KB

Format

Adobe PDF

Checksum

(MD5):77925af410fb56c6d9b9f2d129ee8d89