Probing structural phase transitions of crystalline C60 via resistivity measurements of metal film overlayers
Journal
Solid State Communications
Journal Volume
128
Journal Issue
9-10
Pages
359-363
Date Issued
2003
Author(s)
Abstract
The electrical resistance of thin silver films deposited on C60 crystals shows anomalies near 261, 240, and 100 K. These temperatures coincide, respectively, with the bulk rotational, surface rotational, and quenched disorder structural phase transitions of crystalline C60. Films of other metals on C60 show similar behavior. Our findings demonstrate that thin metal film overlayers are sensitive probes of the structural phase transitions in C60, and also provide evidence for a novel structural-electronic interaction at the metal/C60 interface. © 2003 Elsevier Ltd. All rights reserved.
Publisher
Elsevier B.V.
Type
journal article