A novel dual sided fly-by topology for 1 to 8 DDR with optimized signal integrity by EBG design
Journal
IEEE Transactions on Components, Packaging, and Manufacturing Technology
Journal Volume
8
Journal Issue
10
Pages
7819590
Date Issued
2018
Author(s)
Abstract
A novel dual-sided fly-by topology is proposed for one controller to multiple memory systems by choosing interconnected transmission line sections of alternate impedance and length. After suitable big data analysis of automatic simulation, peak distortion analysis for eye height, followed by artificial neural network optimization, the best design guideline can be deduced, which is found to be consistent to the electromagnetic bandgap (EBG) theory. The topology may greatly enhance the eye height by 20%-100% while the total length is reduced by half, compared with the conventional fly-by topology. The general design method, relevant simulation, and analysis from EBG are also provided. Measurement has been performed to validate the new design, demonstrating 53% improvement in eye height over the conventional one.
SDGs
Type
journal article