Electron microscopy investigations of V defects in multiple InGaN/GaN quantum wells and InGaN quantum dots

Resource

Journal of Microscopy, 237(3), 275-281

Journal

Journal of Microscopy

Pages

275-281

Date Issued

2010

Date

2010

Author(s)

Yang, J.R.

Li, W.C.

Tsai, H.L.

Hsu, J.T.

Shiojiri, M.

DOI

URI

Type

journal article

File(s)

Name

363.pdf

Size

23.47 KB

Format

Adobe PDF

Checksum

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