Publication:
Passivation of GaSb using molecular beam epitaxy Y <inf>2</inf> O <inf>3</inf> to achieve low interfacial trap density and high-performance self-aligned inversion-channel p-metal-oxide-semiconductor field-effect-transistors

cris.lastimport.scopus2025-05-07T22:10:47Z
cris.virtual.departmentApplied Physicsen_US
cris.virtual.departmentCenter for Condensed Matter Sciencesen_US
cris.virtual.departmentElectronics Engineeringen_US
cris.virtual.departmentPhysicsen_US
cris.virtual.orcid0000-0003-4657-0933en_US
cris.virtualsource.department9155e83b-46d3-4e25-8da6-6f15597d416a
cris.virtualsource.department9155e83b-46d3-4e25-8da6-6f15597d416a
cris.virtualsource.department9155e83b-46d3-4e25-8da6-6f15597d416a
cris.virtualsource.department9155e83b-46d3-4e25-8da6-6f15597d416a
cris.virtualsource.orcid9155e83b-46d3-4e25-8da6-6f15597d416a
dc.contributor.authorChu, R.L.en_US
dc.contributor.authorChiang, T.H.en_US
dc.contributor.authorHsueh, W.J.en_US
dc.contributor.authorChen, K.H.en_US
dc.contributor.authorLin, K.Y.en_US
dc.contributor.authorBrown, G.J.en_US
dc.contributor.authorChyi, J.I.en_US
dc.contributor.authorKwo, J.en_US
dc.contributor.authorMINGHWEI HONGen_US
dc.date.accessioned2019-12-27T07:49:19Z
dc.date.available2019-12-27T07:49:19Z
dc.date.issued2014
dc.identifier.doi10.1063/1.4901100
dc.identifier.scopus2-s2.0-84908674296
dc.identifier.urihttps://scholars.lib.ntu.edu.tw/handle/123456789/443326
dc.identifier.urlhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84908674296&doi=10.1063%2f1.4901100&partnerID=40&md5=d890fff9c5742b0735d3331b6d48adfe
dc.relation.ispartofApplied Physics Letters
dc.relation.journalissue18
dc.relation.journalvolume105
dc.titlePassivation of GaSb using molecular beam epitaxy Y <inf>2</inf> O <inf>3</inf> to achieve low interfacial trap density and high-performance self-aligned inversion-channel p-metal-oxide-semiconductor field-effect-transistors
dc.typejournal articleen
dspace.entity.typePublication

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