A Compiler Design Technique for Impulsive VDD Current Minimization

Journal

IEEE Transactions on Electromagnetic Compatibility

Journal Volume

55

Journal Issue

5

Pages

855-866

Date Issued

2013-10

Author(s)

S. Y. Yuan

W. B. Su

G. K. Ni

T. Y. Chi

DOI

10.1109/TEMC.2013.2240459

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/381421

Type

journal article