Extended Electrical and Photonic Characterization of GaN-Based Ultra-Violet MicroLEDs with an ITO Emission Window Layer
Journal
IEEE Photonics Journal
Journal Volume
12
Journal Issue
6
Date Issued
2020
Author(s)
Abstract
We determined the optical and electrical characteristics of GaN-based, ultraviolet micro light emitting diodes (microLEDs). Such microLEDs are essential to next-generation high-resolution micro-displays. Square-shaped microLEDs of different sizes (side lengths: 5-50 μm) were designed. The peak emission wavelength of these devices shifted <0.15 nm during the current injection. The 50 μm device had a 3.8 times greater relative illumination intensity than did the 5 μm device, suggesting a degradation in quantum efficiency in small devices. Measurements of temperature-dependent reverse leakage current indicated (1) thermal activation from deep centers and (2) a high percentage of components with surface recombination current in the small devices. ? 2009-2012 IEEE.
Subjects
III-V semiconductors; Current injections; Electrical characteristic; Peak emission wavelength; Relative illumination; Reverse leakage current; Surface recombinations; Temperature dependent; Thermal activation; Gallium nitride
SDGs
Type
journal article