Ab Initio Study of the Valence-electron Relaxation Effect on X-ray Emission Spectra and the Excitionic Effect on Electron-energy-loss Spectra of the SiL2,3 Edge
Resource
Physical Review, v.B44, p.13393
Journal
Physical Review
Journal Volume
v.B44
Pages
1339-3
Date Issued
1991
Date
1991
Author(s)
Lin, Sheng-Hsien
Type
journal article