Absolute depth measurement using multiphase normalized cross-correlation for precise optical profilometry

Journal

Sensors (Switzerland)

Journal Volume

19

Journal Issue

21

Date Issued

2019

Author(s)

Duong, D.-H.

Chen, C.-S.

LIANG-CHIA CHEN

DOI

10.3390/s19214683

URI

https://www.scopus.com/inward/record.url?eid=2-s2.0-85074272659&partnerID=40&md5=949e52a4ca4a0e3cfd6c7930ba746098

https://scholars.lib.ntu.edu.tw/handle/123456789/547486

Type

journal article