Femtosecond Z-scan measurement of GaN

Resource

Applied Physics Letters 75 (22): 3524-3526

Journal

Applied Physics Letters

Journal Volume

75

Journal Issue

22

Pages

3524-3526

Date Issued

1999

Author(s)

Huang, Y.-L.

Sun, C.-K.

Liang, J.-C.

Keller, S.

Mack, M.P.

Mishra, U.K.

DenBaars, S.P.

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0001441993&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/350021

Type

journal article