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College of Science / 理學院
Applied Physics / 應用物理研究所
Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)
Details
Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)
Journal
CrystEngComm
Journal Volume
14
Journal Issue
23
Pages
8103-8109
Date Issued
2012
Author(s)
Liu, W-R
Lin, BH
Kuo, CC
Lee, WC
MINGHWEI HONG
Kwo, J
Hsu, C-H
Hsieh, WF
DOI
10.1039/c2ce26074c
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/371839
SDGs
[SDGs]SDG7
Type
journal article
