Publication: Relaxation investigation on durability for terminals of CPU socket connectors
| cris.lastimport.scopus | 2025-05-07T22:17:24Z | |
| cris.virtual.department | Biomechatronics Engineering | en_US |
| cris.virtual.orcid | 0000-0003-2531-3401 | en_US |
| cris.virtualsource.department | 0eb3038c-aef1-463f-ba62-6bba999a9246 | |
| cris.virtualsource.orcid | 0eb3038c-aef1-463f-ba62-6bba999a9246 | |
| dc.contributor.author | KUO-CHI LIAO | en |
| dc.creator | Liao, K.-C. and Chang, C.-C. | |
| dc.date.accessioned | 2018-09-10T07:28:00Z | |
| dc.date.available | 2018-09-10T07:28:00Z | |
| dc.date.issued | 2009 | |
| dc.identifier.doi | 10.1016/j.matdes.2008.05.004 | |
| dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-51249089679&partnerID=MN8TOARS | |
| dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/347293 | |
| dc.language | en | en |
| dc.relation.ispartof | Materials and Design | en_US |
| dc.relation.journalissue | 2 | |
| dc.relation.journalvolume | 30 | |
| dc.relation.pages | 252-255 | |
| dc.source | AH | |
| dc.title | Relaxation investigation on durability for terminals of CPU socket connectors | |
| dc.type | journal article | en |
| dspace.entity.type | Publication |