Diagnosis for Sequence Dependent Chips
Journal
IEEE VLSI Test Symposium
Pages
187-192
Date Issued
2002-01
Author(s)
Abstract
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.
Type
conference paper