A Hybrid Algorithm for Test Point Selection for Scan-Based BIST.

Journal

Proceedings of the 34st Conference on Design Automation, Anaheim, California, USA, Anaheim Convention Center, June 9-13, 1997.

Pages

478-483

Date Issued

1997

Author(s)

Tsai, Huan-Chih

Cheng, Kwang-Ting

Lin, Chih-Jen

Bhawmik, Sudipta

DOI

URI

URL

Type

conference paper