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College of Science / 理學院
Applied Physics / 應用物理研究所
Scanning electron microscope identification of weak links in superconducting thin films
Details
Scanning electron microscope identification of weak links in superconducting thin films
Journal
Applied Physics Letters
Journal Volume
53
Journal Issue
13
Pages
1210-1212
Date Issued
1988
Author(s)
Monroe, Don
Brocklesby, WS
Farrow, RC
MINGHWEI HONG
Liou, S. H.
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/340153
Type
journal article
