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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
STI-Induced Mechanical-Stress-Related Kink Effect of 40nm PD SOI NMOS Devices
Details
STI-Induced Mechanical-Stress-Related Kink Effect of 40nm PD SOI NMOS Devices
Journal
European SOI Conference
Date Issued
2008-01
Author(s)
I. S. Lin
V. C. Su
J. B. Kuo
D. Chen
C. S. Yeh
C. T. Tsai
M. Ma
JAMES-B KUO
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/342561
Type
conference paper