Built-In Self-Test Techniques for Dynamic Specifications of ADC and DAC
Date Issued
2006
Date
2006
Author(s)
Chen, Sheng-Tai
DOI
zh-TW
Abstract
In this thesis, we present an on-chip BIST scheme for testing the dynamic specifications of A/D and D/A converters. For dynamic ADC testing, rather than building a sinusoidal waveform generator on chip, we instead emulate the input transitions of a sinusoidal waveform by using a ramp generator together with a DAC. For dynamic DAC testing, we use a ramp generator and a comparator to under-sample the DAC's output waveform and thus don’t require a digital storage oscilloscope to measure the DAC output. The main contribution in this work is that our proposed BIST scheme is no longer confined to static testing. It can measure the dynamic parameters of A/D and D/A converters. Moreover, it can easily be implemented to perform both static testing and dynamic testing. Test time can be traded for test accuracy depending on the applications.
Subjects
數位類比轉換器
類比數位轉換器
內建自我測試
A/D converter
D/A converter
BIST
testing
Type
thesis
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