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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Use of a Ni interlayer to improve the thermal cycling reliability of Cu/sapphire bilayers
Details
Use of a Ni interlayer to improve the thermal cycling reliability of Cu/sapphire bilayers
Journal
International Journal of Applied Ceramic Technology
Journal Volume
12
Journal Issue
3
Pages
685-692
Date Issued
2015
Author(s)
Lee, S.-K.
Tuan, W.-H.
Yang, T.-J.
WEI-HSING TUAN
DOI
10.1111/ijac.12247
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/492164
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84928356087&doi=10.1111%2fijac.12247&partnerID=40&md5=550dd8b8fee73dd929db9777802a0ed1
Type
journal article