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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
Details
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
Journal
2004 IEEE MTT-S International Microwave Symposium
Date Issued
2004-06
Author(s)
H.C.Lu
TAH HSIUNG CHU
DOI
10.1109/mwsym.2004.1338952
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/310501
SDGs
[SDGs]SDG7
Type
conference paper
