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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Process-variation statistical modeling for VLSI timing analysis
Details
Process-variation statistical modeling for VLSI timing analysis
Journal
Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
Pages
730-733
Date Issued
2008
Author(s)
Liu, J.-H.
Zeng, J.-K.
Hong, A.-S.
Chen, L.
CHUNG-PING CHEN
DOI
10.1109/ISQED.2008.4479828
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501045
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-49749143768&doi=10.1109%2fISQED.2008.4479828&partnerID=40&md5=c6952ba9afd1869e15c0a68a03125be4
Type
conference paper
