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  4. Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography
 
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Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography

Journal
Japanese Journal of Applied Physics
Journal Volume
54
Journal Issue
6
Date Issued
2015-06
Author(s)
Hsuan-Ping Lee
Sheng-Yung Chen
Chun-Hung Liu
Ding-Qi
Yu-Tian Shen
KUEN-YU TSAI  
DOI
10.7567/JJAP.54.06FD01
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/394607
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84930691242&doi=10.7567%2fJJAP.54.06FD01&partnerID=40&md5=297e65736ac962ba7ae6420fce7af338
Abstract
To improve the throughput of electron-beam-direct-write lithography (EBDWL), we propose a new electron-optical system (EOS) design method with the capability of systematically optimizing EOSs with various types of emission source. A ball-tip emission source initially proposed by another group is further discussed. A numerical optimization method is utilized in the design method to maximize EOS emission current while satisfying constraints including the size of the electron beam spot and the amount of induced electric field on electrodes and insulators inside EOSs. For performance comparison, two EOSs, one with a generic emission source and the other with a ball-tip emission source, are designed using the proposed method. Preliminary results indicate that a sixfold emission current is obtained from the EOS with the ball-tip emission source. Furthermore, patterning fidelity investigations are conducted using the obtained design results. It is shown that the higher emission current from the ball-tip emission source is achieved without compromising patterning quality. © 2015 The Japan Society of Applied Physics.
SDGs

[SDGs]SDG7

Other Subjects
Electron beams; Electrons; Electrooptical effects; Numerical methods; Optical systems; Optimization; Electron beam direct write lithographies; Electron optical system; Emission current; Emission sources; High throughput; Induced electric fields; Numerical optimizations; Performance comparison; Design
Type
journal article

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