On-wafer testing of MMIC with monolithically integrated photoconductive switches

Journal

IEEE MTT-S International Microwave Symposium

Journal Volume

2

Pages

661-664

Date Issued

1992

Author(s)

Huang, S.L.

Chauchard, E.A.

Lee, C.H.

Lee, T.T.

Hung, H.-L.A.

Joseph, T.

SHENG-LUNG HUANG

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0027075692&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/298216

Type

conference paper