OBDD-based network reliability calculation
Resource
Electronics Letters
Journal
Electronics Letters
Pages
-
Date Issued
1997-04
Date
1997-04
Author(s)
Yeh, Fu-Min
DOI
0013-5194
Abstract
An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2 × 20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity.
Subjects
Reliability theory
Other Subjects
Algorithms; Boolean functions; Calculations; Decision theory; Failure analysis; Graph theory; Heuristic methods; Probability; Recursive functions; Reliability theory; Ordered binary decision diagram; Terminal pair reliability; Networks (circuits)
Type
journal article
File(s)
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Name
00590216.pdf
Size
320.38 KB
Format
Adobe PDF
Checksum
(MD5):76f8b3b4dcf16a48b9e148df3600fa31