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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
A static bidirectional learning technique to accelerate test pattern generation
Details
A static bidirectional learning technique to accelerate test pattern generation
Journal
International SoC Design Conference
Date Issued
2015
Author(s)
J.-H. Pan
K.-W. Yeh
J.-L. Huang
JIUN-LANG HUANG
DOI
10.1109/isocc.2015.7401692
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429669
Type
conference paper