A new NBTI characterization method on polycrystalline silicon thin-film transistors
Journal
IDW '08 - 15th International Display Workshops
Journal Volume
2
Pages
659-662
Date Issued
2008
Author(s)
Sun, H.-C.
Huang, C.-F.
Chen, Y.-T.
Liu, C.W.
Hsu, Y.-C.
Shih, C.-C.
Chen, J.-S.
Type
conference paper