A do-it-yourself atomic force microscope using printed circuit board framework
Journal
Measurement Science and Technology
Journal Volume
36
Journal Issue
9
Start Page
097003
ISSN
09570233
Date Issued
2025-09-30
Author(s)
Wang, Jen-Hung
Bütefisch, Sebastian
Danzebrink, Hans Ulrich
Hwang, Ing-Shouh
Hwu, Edwin En-Te
Abstract
The atomic force microscope (AFM) is a high-resolution instrument that has applications in nanoscience. However, the cost and complexity of an AFM are barriers for people to access this tool. In this study, we design and evaluate a do-it-yourself (DIY) AFM by using low-cost consumer electronic components. In the DIY AFM, a precise scanner and cantilever detection system were realized using disk buzzers and an optical pickup unit, respectively. The mechanical framework with an optional anti-vibration suspension was constructed using printed circuit boards (PCBs), which allows the users to assemble the AFM easily. Experiments verified that the DIY AFM can achieve subnanometer resolution in the vertical direction. The PCB framework supported high-speed scanning at a scan rate of 40 lines s−1 and had a low thermal drift of approximately 6.2 nm min−1.
Subjects
atomic force microscope
do-it-yourself
high speed scanning
Publisher
Institute of Physics
Type
journal article