Near-edge Fine Structure Analysis of Core Shell Electronic Absorption Edges in Si and Its Refractory Compounds Using Electron Energy Loss Microscopy
Resource
Journal of Applied Physics, v.62, p.2439
Journal
Journal of Applied Physics
Journal Volume
v.62
Pages
243-9
Date Issued
1987
Date
1987
Author(s)
Lin, Sheng-Hsien
Type
journal article