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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
High field drift velocity of 2DEG in Si/SiGe heterostructures as determined by magnetoresistance techniques
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High field drift velocity of 2DEG in Si/SiGe heterostructures as determined by magnetoresistance techniques
Journal
Annual Device Research Conference Digest
Pages
26-27
Date Issued
1996
Author(s)
CHEE-WEE LIU
Madhavi, S.
Venkataraman, V.
Liu, C.W.
Sturm, J.C.
CHEE-WEE LIU
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0029703418&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/324171
Type
conference paper
