Simultaneous capture and shift power reduction test pattern generator for scan testing

Resource

IET Computers & Digital Techniques 2 (2): 132-141

Journal

IET Computers & Digital Techniques

Journal Volume

2

Journal Issue

2

Pages

132-141

Date Issued

2008

Date

2008

Author(s)

Lin, H.-T.

Li, J.C.-M.

URI

Type

journal article

File(s)

Name

09.pdf

Size

315.01 KB

Format

Adobe PDF

Checksum

(MD5):9065b5ee4501f0e2f50539c130ac1f59