Mechanically strained Si-SiGe HBTs

Journal

IEEE Electron Device Letters

Journal Volume

25

Journal Issue

7

Pages

483-485

Date Issued

2004

Author(s)

Yuan, F.

Jan, S.-R.

Maikap, S.

Liu, Y.-H.

Liang, C.-S.

DOI

10.1109/LED.2004.831223

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-3343014149&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/309369

Type

journal article