Power scan: OFT for power switches in VLSI designs

Journal

Proceedings - International Test Conference

Date Issued

2009

Author(s)

Bai, B.-C.

Li, C.-M.

Kifli, A.

Tsai, E.

DOI

10.1109/TEST.2009.5355631

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505979

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-76549087120&doi=10.1109%2fTEST.2009.5355631&partnerID=40&md5=14412dc4391bc51f7ccb9d72839d1865

Type

conference paper