Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Industrial Engineering / 工業工程學研究所
Sample Efficient Regression Trees (SERT) for yield loss analysis
Details
Sample Efficient Regression Trees (SERT) for yield loss analysis
Journal
IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
Pages
29-32
Date Issued
2006
Author(s)
Chen, A.
Hong, A.
Ho, O.
Liu, C.-W.
Huang, Y.-H.
ARGON CHEN
DOI
10.1109/ISSM.2006.4493014
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/467253
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-50249172891&doi=10.1109%2fISSM.2006.4493014&partnerID=40&md5=a6409fad90b6e5f856d3284de12296a6
Type
conference paper
