Reply to 'comment on 'A compact analytic model of the strain field induced by through ilicon vias''
Journal
IEEE Transactions on Electron Devices
Journal Volume
62
Journal Issue
9
Date Issued
2015
Author(s)
Jan, S.-R.
Chou, T.-P.
Yeh, C.-Y.
Liu, C.W.
Goldstein, R.V.
Gorodtsov, V.A.
Shushpannikov, P.S.
Type
journal article