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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique
Details
Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique
Journal
IEEE International Test Conference
Date Issued
2006-10
Author(s)
CHIEN-MO LI
Y. L Kao
W. S. Chuang
CHIEN-MO LI
DOI
10.1109/TEST.2006.297659
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/325776
Type
conference paper
