Foreword
Journal
2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012
Date Issued
2012
Author(s)
Abstract
On behalf of the organizing committee, we would like to welcome you to the 2012 International Symposium on VLSI Design, Automation, and Test (2012 VLSI-DAT). As in the past seven years, the Symposium carries on its mission to bring together industry and academic experts to exchange and disseminate their latest R&D findings and accomplishments. The scope of the work presented at the Symposium spans from advanced analog/mixed-signal/RF and SoC design to design automation, testing and manufacturability. The Symposium continues to provide a dynamic environment and synergistic setting for researchers from all over the world to discuss the most current progress with the Taiwan's local experts. This year, along with its sister conference, the Symposium features one joint plenary session and two joint topic sessions. VLSI-DAT itself features two plenary talks, one special talk, two special topic sessions, two invited industrial sessions, 14 technical sessions and one poster session.
SDGs
Type
conference paper