Interfacial thermal resistance between light and matter
Journal
2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
ISBN
978-172810469-0
Date Issued
2019
Author(s)
Abstract
Summary form only given. Interfacial thermal resistance is an important effect for experimental probing thermal transport of materials and ignoring the effect will always mislead interpretations of experimental data [1]. Although many people claim that employing optical methods to probe thermal transport of materials would be free from the unwanted effect, we find the claim is unjustified. Hence we design a platform to determine whether there is interfacial thermal resistance (R light-matter ) when shining a light beam onto the surface of a material. The platform consisted of a suspended, H-shaped, SiN x beam with Pt thin film deposited on it. As shown in Fig. 1(a), the two vertical beams were used as independent heater/sensor. We had also employed focused ion beam (FIB) to cut the Pt film so as to electrically isolate the two vertical beams, as shown in the inset of Fig. 1(a). Then a laser beam was focused onto different positions of the horizontal beam to measure its length-dependent thermal resistance. The local temperature under the laser spot was measured by raising the temperature of one of the vertical beam until the heat flux of the laser beam only dissipates through another vertical beam. The experiment was repeated after flipping the sample upside-down so that the laser could be shined on the surface of Pt and SiN x , respectively.
Publisher
Institute of Electrical and Electronics Engineers Inc.
Type
conference paper