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College of Science / 理學院
Applied Physics / 應用物理研究所
Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectance
Details
Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectance
Journal
Journal of Applied Physics
Journal Volume
83
Journal Issue
5
Pages
2857-2859
Date Issued
1998
Author(s)
Hwang, JS
Wang, YC
Chou, WY
Tyan, SL
MINGHWEI HONG
Mannaerts, JP
Kwo, J
others
DOI
10.1063/1.367047
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/340147
Type
journal article