Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectance
Journal
Journal of Applied Physics
Journal Volume
83
Journal Issue
5
Pages
2857-2859
Date Issued
1998
Author(s)
Abstract
Built-in electric fields and interfacial state densities (Dit) in a series of oxide–GaAs heterostructures fabricated by in situ molecular beam epitaxy were studied using room temperature photoreflectance. The samples investigated were air-, Al2O3–Ga2Ox–, and Ga2O3(Gd2O3)–GaAs. We found that the built-in electric fields are 48, 44, and 38 kV/cm for air-, Al2O3-, and Ga2Ox–GaAs samples, respectively. For the Ga2O3(Gd2O3)–GaAs sample, the built-in electric field is negligibly small, indicating a very low interfacial state density. Estimated by the low field limit criterion, Dit is less than 1×1011 cm−2 eV−1. Our results on the Ga2O3(Gd2O3)–GaAs sample are consistent with the data obtained previously using capacitance–voltage measurements in quasistatic/high frequency modes and photoluminescence measurements.
SDGs
Type
journal article