Analysis of eddy currents in a bar containing an embedded defect

Journal

NDT and E International

Journal Volume

32

Journal Issue

5

Pages

293-303

Date Issued

1999

Author(s)

Liaw, J.W.

Chu, S.L.

Yeh, C.S.

Kuo, M.K.

DOI

10.1016/S0963-8695(98)00051-6

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/486747

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032681249&doi=10.1016%2fS0963-8695%2898%2900051-6&partnerID=40&md5=63481cca85ebc91b78cd2b8e91223a0e

Type

journal article