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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Lissajous Hierarchical Local Scanning to Increase the Speed of Atomic Force Microscopy
Details
Lissajous Hierarchical Local Scanning to Increase the Speed of Atomic Force Microscopy
Journal
IEEE Transactions on Nanotechnology
Journal Volume
14
Journal Issue
5
Pages
810-819
Date Issued
2015
Author(s)
Wu, J.-W.
Lin, Y.-T.
Lo, Y.-T.
Liu, W.-C.
LI-CHEN FU
DOI
10.1109/TNANO.2015.2445712
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/488901
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960336369&doi=10.1109%2fTNANO.2015.2445712&partnerID=40&md5=ac488ddacdbce3c7bffcbf207fbf211e
Type
journal article