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Photoluminescence and Raman Scattering characterization of GaN, InGaN and AlGaN films using a UV Excitation Raman-Photoluminescence microscope
Resource
Materials Science Forum,264-268,1359-1362.
Journal
Materials Science Forum
Pages
264-268
Date Issued
1998-01
Date
1998-01
Author(s)
Feng, Z.C.
Schurman, M.
Tran, C.
Salagaj, T.
Karlicek, B.
Ferguson, I.
Stall, R.A.
Dyer, C.D.
Williams, K.P.J.
Pitt, G.D.
Type
journal article