TEASE: A Systematic Analysis Framework for Early Evaluation of FinFET-based Advanced Technology Nodes
Journal
50th ACM/EDAC/IEEE Design Automation Conference (DAC’13)
Pages
1-6
Date Issued
2013-06
Author(s)
A. Mallik
P. Zuber
T.-T. Liu
B. Chava
B. Ballal
P. Royer
K. Croes
B. Rogier
R. Julien
A. Mercha
M. Badaroglu
D. Verkest
SDGs
Type
conference paper