Test set compaction for combinational circuits

Resource

Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)

Journal

Test Symposium, 1992. (ATS '92)

Pages

Proceeding-s

Date Issued

1992-11

Date

1992-11

Author(s)

Chang, Jau-Shien

Lin, Chen-Shang

DOI

DOI

N/A

URI

Type

journal article

File(s)

Name

00224429.pdf

Size

473.02 KB

Format

Adobe PDF

Checksum

(MD5):186e53655bee451a350d3c65441ac90d