Ge gate-all-around FETs on Si
Journal
Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
Date Issued
2014
Author(s)
Abstract
High performance Ge inversion (INV) and junctionless (JL) gate-all-around (GAA) FETs are demonstrated on epi-Ge layer on SOI. The anisotropic etching is used to remove the defect near the Ge/Si interface and to form gate-all-around structure. The INV and JL pGAAFETs have I on of 235 μA/μm and 270 μA/μm at V GS - V T = -2 V and V DS = -1 V, respectively, and show good subthreshold characteristics. The (111) sidewall INV nFETs show 2X enhanced I on of 110 μA/μm with respect to the devices with near (110) sidewalls.
SDGs
Type
conference paper