Comparing retention and recombination of electrically injected carriers in Si quantum dots embedded in Si-rich SiN <inf>x</inf> films

Journal

Applied Physics Letters

Journal Volume

99

Journal Issue

24

Date Issued

2011

Author(s)

Lin, C.-D.

Cheng, C.-H.

Lin, Y.-H.

Wu, C.-L.

Pai, Y.-H.

DOI

10.1063/1.3663530

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500268

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-83755173238&doi=10.1063%2f1.3663530&partnerID=40&md5=d60c36d4895396d4c81531cb8aead8b1

Type

journal article